Share Share Share

The fabrication and characterization of half-Heusler YPdBi thin films

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS

POLAT, Ö.; ARREGI URIBEETXEBARRIA, J.; HORÁK, M.; POLČÁK, J.; BUKVIŠOVÁ, K.; ZLÁMAL, J.; ŠIKOLA, T., 2022: The fabrication and characterization of half-Heusler YPdBi thin films. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS 161, p. 1 - 6, doi: 10.1016/j.jpcs.2021.110447; FULL TEXT
(MAGNETRON, RIGAKU9, TITAN, HELIOS, KRATOS-XPS, CRYOGENIC, LYRA)

Equipment:

• Magnetron sputtering system BESTEC
• X-ray diffractometer with high brightness source Rigaku SmartLab 9kW
• High-resolution (scanning) Transmission Electron Microscope FEI Titan Themis 60-300 cubed
• Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660
• X-ray Photoelectron Spectroscopy Axis Supra
• Low Temperature Vibrating Sample Magnetometr Cryogenic Limited
• Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3

Research Groups:

• CF: CEITEC Nano
• Fabrication and Characterisation of Nanostructures
• Nanomagnetism and Spintronics

CEITEC authors:

• M.Sc. Jon Ander Arregi Uribeetxebarria, Ph.D.
• Josef Polčák, Ph.D.
• Kristýna Bukvišová
• Michal Horák, Ph.D.
• Jakub Zlámal, Ph.D.
• Prof. Tomáš Šikola