Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO3 Films on Silicon

ACS OMEGA

FAWAEER, S.; AL-QAISI, W.; SEDLÁKOVÁ, V.; MOUSA, M.; KNÁPEK, A.; SOBOLA, D., 2026: Role of Buffer Layers in Defect Chemistry and Parasitic Phase Formation of BiFeO3 Films on Silicon. ACS OMEGA 11(5), p. 7782 - 7795, doi: 10.1021/acsomega.5c08852; FULL TEXT
(RIGAKU3, VERIOS, UHV-PLD, MAGNETRON, KRATOS-XPS)

Equipment:

X-ray powder diffractometer Rigaku SmartLab 3kW
High resolution Scanning Electron Microscope FEI Verios 460L
UHV Preparation and Analytical System - Pulsed Laser Deposition TSST
Magnetron sputtering system BESTEC
X-ray Photoelectron Spectroscopy Axis Supra

Research Groups:

Advanced Ceramic Materials
CF: CEITEC Nano

CEITEC authors:

Dinara Sobola, Ph.D.
Vlasta Sedláková, Ph.D.
Saleh Hekmat Saleh Fawaeer