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Single-layer graphene on epitaxial FeRh thin films
APPLIED SURFACE SCIENCE
UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F., 2020: . APPLIED SURFACE SCIENCE 514, p. 145923-1 - 7, doi: 10.1016/j.apsusc.2020.145923; FULL TEXT
(MAGNETRON, VERSALAB, RIGAKU9, UHV-LEEM, UHV-LEIS, UHV-SPM, UHV-PREPARATION, UHV-XPS, SIMS)
Equipment:
- Magnetron sputtering system BESTEC
- Cryogenic-free VSM and ETO measurement system – Quantum Design, VersaLab
- X-ray diffractometer with high brightness source Rigaku SmartLab 9kW
- UHV Preparation and Analytical System - Low Energy Electron Microscope SPECS FE-LEEM P90
- UHV Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100
- UHV Preparation and Analytical System - Scanning Probe Microscopy SPECS Aarhus 150 SPM
- Ultra High Vacuum Preparation and Analytical System - Preparation Chamber SPECS
- UHV Preparation and Analytical system - Photoelectron Spectroscopy SPECS Phoibos 150
- Secondary Ion Mass Spectroscopy ION-TOF TOF.SIMS5
Research Groups:
- Fabrication and Characterisation of Nanostructures
- CF: CEITEC Nano
- Molecular Nanostructures at Surfaces
- Nanomagnetism and Spintronics
CEITEC authors: